Problem matched basis functions are proposed for the method of moments analysis of printed slot coupled microstrips. The appropriate equivalent currents of the integral equation kernel are represented in terms of two sets of entire domain basis functions. These functions synthesize on one hand the resonant behavior of slots, microstrips or dipoles and on the other hand the field in proximity of the feeding source and of the discontinuities. In order to define these basis functions, canonical geometries are identified, whose Green's functions have been found in semi-analytical form. The accuracy and the effectiveness of the method in terms of convergence rate and number of unknowns is demonstrated by comparison with a standard fine meshing full-wave analysis. The method is extremely convenient for large arrays, where the subwavelength details should be treated together with large global dimensions. Since the proposed solution is independent of the dimensions of these details, it provides dramatic reduction of the number of unknowns and improvement of condition number.

S., B., N., L., A., N., G., G., & Maci, S. (2005). Problem-matched basis functions for microstrip coupled slot arrays based on transmission line Green's functions (TLGF). IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION, 53(11), 3556-3567 [10.1109/TAP.2005.858581].

Problem-matched basis functions for microstrip coupled slot arrays based on transmission line Green's functions (TLGF)

MACI, STEFANO
2005

Abstract

Problem matched basis functions are proposed for the method of moments analysis of printed slot coupled microstrips. The appropriate equivalent currents of the integral equation kernel are represented in terms of two sets of entire domain basis functions. These functions synthesize on one hand the resonant behavior of slots, microstrips or dipoles and on the other hand the field in proximity of the feeding source and of the discontinuities. In order to define these basis functions, canonical geometries are identified, whose Green's functions have been found in semi-analytical form. The accuracy and the effectiveness of the method in terms of convergence rate and number of unknowns is demonstrated by comparison with a standard fine meshing full-wave analysis. The method is extremely convenient for large arrays, where the subwavelength details should be treated together with large global dimensions. Since the proposed solution is independent of the dimensions of these details, it provides dramatic reduction of the number of unknowns and improvement of condition number.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11365/404518