In this paper (split into Part I and II), an extensive comparison of existing flip-flop (FF) classes and topologies is carried out. In contrast to previous works, analysis explicitly accounts for effects that arise in nanometer technologies and affect the energy-delay-area tradeoff (e.g., leakage and the impact of layout and interconnects). Compared to previous papers on FFs comparison, the analysis involves a significantly wider range of FF classes and topologies. In particular, in this Part I, the comparison strategy, which includes the simulation setup, the energy-delay estimation methodology and an overview of an optimum design strategy [24], together with the introduction of the analyzed FF classes and topologies, are reported.

Alioto, M.B.C., E., C., G., P. (2011). Analysis and Comparison in the Energy-Delay-Area Domain of Nanometer CMOS Flip-Flops: Part I - Methodology and Design Strategies. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 19(5), 725-736.

Analysis and Comparison in the Energy-Delay-Area Domain of Nanometer CMOS Flip-Flops: Part I - Methodology and Design Strategies

ALIOTO, MASSIMO BRUNO CRIS;
2011-01-01

Abstract

In this paper (split into Part I and II), an extensive comparison of existing flip-flop (FF) classes and topologies is carried out. In contrast to previous works, analysis explicitly accounts for effects that arise in nanometer technologies and affect the energy-delay-area tradeoff (e.g., leakage and the impact of layout and interconnects). Compared to previous papers on FFs comparison, the analysis involves a significantly wider range of FF classes and topologies. In particular, in this Part I, the comparison strategy, which includes the simulation setup, the energy-delay estimation methodology and an overview of an optimum design strategy [24], together with the introduction of the analyzed FF classes and topologies, are reported.
2011
Alioto, M.B.C., E., C., G., P. (2011). Analysis and Comparison in the Energy-Delay-Area Domain of Nanometer CMOS Flip-Flops: Part I - Methodology and Design Strategies. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 19(5), 725-736.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11365/22043
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