Single crystal X-ray diffraction was applied in order to investigate defect-induced microstructures in radiation damaged zircon. The formation of domains with different degrees of order was observed and in particular, it was possible to distinguish two types of defects: isolated lattice defects and dislocations. These lattice deformations have a great influence on the structural and physical properties of the materials.
Chrosch, J., Colombo, M., Biagini, R., Turbanti, I. (1999). Defect-induced microstructures: an X-ray diffraction analysis. JOURNAL OF MATERIALS SCIENCE, 34(10), 2263-2268 [10.1023/A:1004517422465].
Defect-induced microstructures: an X-ray diffraction analysis
TURBANTI, ISABELLA
1999-01-01
Abstract
Single crystal X-ray diffraction was applied in order to investigate defect-induced microstructures in radiation damaged zircon. The formation of domains with different degrees of order was observed and in particular, it was possible to distinguish two types of defects: isolated lattice defects and dislocations. These lattice deformations have a great influence on the structural and physical properties of the materials.
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Zircon 2.pdf
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AbsZirc2.pdf
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https://hdl.handle.net/11365/6763
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