The integrity of ceramic material is assessed by means of an high frequency (50 MHz) large bandwidth ultrasonic technique. C-mode images are produced which represent both the amplitude and spectral centroid of the sample back-surface echoes. The comparison of the two image kinds ensures a better evaluation of the defect shape, because it hilights the filtering effect of the flaw on the forward propagating ultrasonic wave.

E., B., Fort, A., L., M. (1998). Shadow images for subtle defect detection in ceramic materials. ALTA FREQUENZA - RIVISTA DI ELETTRONICA, 10, 48-50.

Shadow images for subtle defect detection in ceramic materials

FORT, ADA;
1998-01-01

Abstract

The integrity of ceramic material is assessed by means of an high frequency (50 MHz) large bandwidth ultrasonic technique. C-mode images are produced which represent both the amplitude and spectral centroid of the sample back-surface echoes. The comparison of the two image kinds ensures a better evaluation of the defect shape, because it hilights the filtering effect of the flaw on the forward propagating ultrasonic wave.
1998
E., B., Fort, A., L., M. (1998). Shadow images for subtle defect detection in ceramic materials. ALTA FREQUENZA - RIVISTA DI ELETTRONICA, 10, 48-50.
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11365/33042
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo