This paper addresses the fault diagnosis issue based on a simulation before test philosophy in analog electronic circuits. Diagnosis, obtained by comparing signatures measured at the test nodes with those contained in a fault dictionary, allows for sub-systems testing and fault isolation within the circuit. A novel method for constructing the fault dictionary under the single faulty component/unit hypothesis is proposed. The method, based on a harmonic analysis, allows for selecting the most suitable test input stimuli and nodes by means of a global sensitivity approach efficiently carried out by randomized algorithms. Applicability of the method to a wide class of circuits and its integration in diagnosis tools are granted since randomized algorithms assure that the selection problem can be effectively carried out with a poly-time algorithm independently from the fault space, structure, and complexity of the circuit.
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|Titolo:||SBT soft fault diagnosis in analog electronic circuits: a sensitivity-based approach by randomized algorithms|
|Citazione:||Alippi, C., Catelani, M., Fort, A., & Mugnaini, M. (2002). SBT soft fault diagnosis in analog electronic circuits: a sensitivity-based approach by randomized algorithms. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 51, 1116-1125.|
|Appare nelle tipologie:||1.1 Articolo in rivista|