A new interesting technique for fault diagnosis in non-linear analog systems is presented. The approach is based on a neural network interpolator for the construction of a fault dictionary in the frequency domain. A Multi-Layered architecture with one hidden layer is chosen in order to locate and to identify the most likely faulty element of the System Under Test (SUT). © 1994 IEEE.

Iuculano, G., Catelani, M., Cori, M., Bagnoli, S., Billi, D. (1994). A neural network-based approach for fault diagnosis in non-linear analog systemsConference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9). In Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) (pp.197-200). IEEE [10.1109/IMTC.1994.352093].

A neural network-based approach for fault diagnosis in non-linear analog systemsConference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)

Cori M.;
1994-01-01

Abstract

A new interesting technique for fault diagnosis in non-linear analog systems is presented. The approach is based on a neural network interpolator for the construction of a fault dictionary in the frequency domain. A Multi-Layered architecture with one hidden layer is chosen in order to locate and to identify the most likely faulty element of the System Under Test (SUT). © 1994 IEEE.
1994
0780318803
Iuculano, G., Catelani, M., Cori, M., Bagnoli, S., Billi, D. (1994). A neural network-based approach for fault diagnosis in non-linear analog systemsConference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9). In Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) (pp.197-200). IEEE [10.1109/IMTC.1994.352093].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11365/37726
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