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This paper concerns the characterization and modelling of single crystalline tin oxide nanowires used as CO sensors. In this work we analyze the performance of these devices when they are used with variable operating temperatures. The aim is reducing the power consumption and establishing a model suitable for the development of sensing systems working with programmed temperature protocols. In particular we developed and tested a model for the dynamic behaviour of the sensor able to predict the sensor response during transients. This model can be therefore exploited for the selection of optimum temperature profiles targeted to specific applications.

Fort, A., Mugnaini, M., Vignoli, V., Rocchi, S., Comini, E., Faglia, G., et al. (2009). Characterization and modelling of SnO2 nanowire sensors for CO detection. In Proceedings of the 3rd International Workshop on Advances in sensors and Interfaces (pp.41-45). New York : IEEE [10.1109/IWASI.2009.5184765].

Characterization and modelling of SnO2 nanowire sensors for CO detection

FORT, ADA;MUGNAINI, MARCO;VIGNOLI, VALERIO;ROCCHI, SANTINA;
2009-01-01

Abstract

This paper concerns the characterization and modelling of single crystalline tin oxide nanowires used as CO sensors. In this work we analyze the performance of these devices when they are used with variable operating temperatures. The aim is reducing the power consumption and establishing a model suitable for the development of sensing systems working with programmed temperature protocols. In particular we developed and tested a model for the dynamic behaviour of the sensor able to predict the sensor response during transients. This model can be therefore exploited for the selection of optimum temperature profiles targeted to specific applications.
2009
9781424447084
Fort, A., Mugnaini, M., Vignoli, V., Rocchi, S., Comini, E., Faglia, G., et al. (2009). Characterization and modelling of SnO2 nanowire sensors for CO detection. In Proceedings of the 3rd International Workshop on Advances in sensors and Interfaces (pp.41-45). New York : IEEE [10.1109/IWASI.2009.5184765].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11365/3320
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