In this paper we discuss the possible use of chaotic signals for testing Analog to Digital Converters (ADCs). In detail, exploiting a chaos-based discrete-time noise generator, a method for generating test samples with a distribution arbitrarly close to the uniform one is proposed, and their use for the Code Density Test (also known as Histogram Test) of ADC is discussed.
Addabbo, T., Fort, A., Rocchi, S., Vignoli, V. (2010). Histogram test of ADCs with chaotic samples. In Proceedings of the 2010 IEEE International Instrumentation and Measurement Technology Conference (2010 I2MTC) (pp.546-549). New York : IEEE [10.1109/IMTC.2010.5488041].
Histogram test of ADCs with chaotic samples
ADDABBO, TOMMASO;FORT, ADA;ROCCHI, SANTINA;VIGNOLI, VALERIO
2010-01-01
Abstract
In this paper we discuss the possible use of chaotic signals for testing Analog to Digital Converters (ADCs). In detail, exploiting a chaos-based discrete-time noise generator, a method for generating test samples with a distribution arbitrarly close to the uniform one is proposed, and their use for the Code Density Test (also known as Histogram Test) of ADC is discussed.
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https://hdl.handle.net/11365/32105
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