In this paper we discuss the possible use of chaotic signals for testing Analog to Digital Converters (ADCs). In detail, exploiting a chaos-based discrete-time noise generator, a method for generating test samples with a distribution arbitrarly close to the uniform one is proposed, and their use for the Code Density Test (also known as Histogram Test) of ADC is discussed.

Addabbo, T., Fort, A., Rocchi, S., Vignoli, V. (2010). Histogram test of ADCs with chaotic samples. In Proceedings of the 2010 IEEE International Instrumentation and Measurement Technology Conference (2010 I2MTC) (pp.546-549). New York : IEEE [10.1109/IMTC.2010.5488041].

Histogram test of ADCs with chaotic samples

ADDABBO, TOMMASO;FORT, ADA;ROCCHI, SANTINA;VIGNOLI, VALERIO
2010-01-01

Abstract

In this paper we discuss the possible use of chaotic signals for testing Analog to Digital Converters (ADCs). In detail, exploiting a chaos-based discrete-time noise generator, a method for generating test samples with a distribution arbitrarly close to the uniform one is proposed, and their use for the Code Density Test (also known as Histogram Test) of ADC is discussed.
2010
978-1-4244-2833-5
Addabbo, T., Fort, A., Rocchi, S., Vignoli, V. (2010). Histogram test of ADCs with chaotic samples. In Proceedings of the 2010 IEEE International Instrumentation and Measurement Technology Conference (2010 I2MTC) (pp.546-549). New York : IEEE [10.1109/IMTC.2010.5488041].
File in questo prodotto:
File Dimensione Formato  
C63.pdf

non disponibili

Tipologia: Post-print
Licenza: NON PUBBLICO - Accesso privato/ristretto
Dimensione 753.28 kB
Formato Adobe PDF
753.28 kB Adobe PDF   Visualizza/Apri   Richiedi una copia

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11365/32105
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo