In this paper, a fast iterative physical optics (FIPO) algorithm is proposed for analysis of scattering from electrically large objects involving multiple reflections. When the scenario to be analyzed is electrically very large, a Fast Far Field Approximation (FaFFA) algorithm, based on a domain decomposition of the scatterer surface, can be conveniently used to greatly speed-up the calculation of the induced currents at each step of the iterative procedure. In this work, an efficient and accurate interpolation scheme has been combined to the standard FaFFA algorithm implementation further reducing the complexity of the computation.

De Vita, P., Mori, A., Pandolfo, L., Bercigli, M., Bandinelli, M., Carluccio, G., et al. (2017). Analysis of Scattering from Electrically Large Objects Using Fast Far Field Iterative Physical Optics. In 2017 11th European Conference on Antennas and Propagation (EUCAP) (pp.509-512). New York : IEEE [10.23919/EuCAP.2017.7928709].

Analysis of Scattering from Electrically Large Objects Using Fast Far Field Iterative Physical Optics

Albani, Matteo
2017-01-01

Abstract

In this paper, a fast iterative physical optics (FIPO) algorithm is proposed for analysis of scattering from electrically large objects involving multiple reflections. When the scenario to be analyzed is electrically very large, a Fast Far Field Approximation (FaFFA) algorithm, based on a domain decomposition of the scatterer surface, can be conveniently used to greatly speed-up the calculation of the induced currents at each step of the iterative procedure. In this work, an efficient and accurate interpolation scheme has been combined to the standard FaFFA algorithm implementation further reducing the complexity of the computation.
2017
978-8-8907-0187-0
De Vita, P., Mori, A., Pandolfo, L., Bercigli, M., Bandinelli, M., Carluccio, G., et al. (2017). Analysis of Scattering from Electrically Large Objects Using Fast Far Field Iterative Physical Optics. In 2017 11th European Conference on Antennas and Propagation (EUCAP) (pp.509-512). New York : IEEE [10.23919/EuCAP.2017.7928709].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11365/1321974