This paper describes a general purpose high reliable DAQ for widely used sensor families. The development of a system which allows performing fast multi-channel data acquisition and ACD testing by means of single and two tone tests grants high reliability [2].
Catelani, M., Campani, E., Del Pistoia, M., Singuaroli, R., Mugnaini, M., Fort, A. (2003). High reliable DAQ for ADC on line testing. In Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003. Perugia : Università degli Studi di Perugia.
High reliable DAQ for ADC on line testing
Mugnaini, M.;Fort, A.
2003-01-01
Abstract
This paper describes a general purpose high reliable DAQ for widely used sensor families. The development of a system which allows performing fast multi-channel data acquisition and ACD testing by means of single and two tone tests grants high reliability [2].
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https://hdl.handle.net/11365/1321200