IRIS

We discuss a monitoring system aiming to select, among a set of integrated entropy sources affected by process variability, the source guarantying the highest worst-case entropy. The approach is particularly suitable when considering True Random Number Generators based on Digital Nonlinear Oscillators, since multiple instances of the entropy sources can be implemented at a reduced hardware cost. In general, the approach can be applied for TRNGs based on parametric systems, thus offering entropy tuning capabilities. The original theoretical results have been validated with experiments.

Addabbo, T., Fort, A., Mugnaini, M., Moretti, R., Vignoli, V., Papini, D. (2022). A Low-Complexity Method to Address Process Variability in True Random Number Generators based on Digital Nonlinear Oscillators. In 2022 IEEE International Symposium on Circuits and Systems (ISCAS) (pp.1670-1674). New York : Institute of Electrical and Electronics Engineers Inc. [10.1109/ISCAS48785.2022.9937869].

A Low-Complexity Method to Address Process Variability in True Random Number Generators based on Digital Nonlinear Oscillators

Addabbo T.
;Fort A.;Mugnaini M.;Moretti R.;Vignoli V.;
2022-01-01

Abstract

We discuss a monitoring system aiming to select, among a set of integrated entropy sources affected by process variability, the source guarantying the highest worst-case entropy. The approach is particularly suitable when considering True Random Number Generators based on Digital Nonlinear Oscillators, since multiple instances of the entropy sources can be implemented at a reduced hardware cost. In general, the approach can be applied for TRNGs based on parametric systems, thus offering entropy tuning capabilities. The original theoretical results have been validated with experiments.
2022
978-1-6654-8485-5
Addabbo, T., Fort, A., Mugnaini, M., Moretti, R., Vignoli, V., Papini, D. (2022). A Low-Complexity Method to Address Process Variability in True Random Number Generators based on Digital Nonlinear Oscillators. In 2022 IEEE International Symposium on Circuits and Systems (ISCAS) (pp.1670-1674). New York : Institute of Electrical and Electronics Engineers Inc. [10.1109/ISCAS48785.2022.9937869].
4.1 Contributo in Atti di convegno
File in questo prodotto:
File Dimensione Formato  
A_Low-Complexity_Method_to_Address_Process_Variability_in_True_Random_Number_Generators_based_on_Digital_Nonlinear_Oscillators.pdf

non disponibili

Tipologia: PDF editoriale
Licenza: NON PUBBLICO - Accesso privato/ristretto
Dimensione 773.88 kB
Formato Adobe PDF
  Visualizza/Apri   Richiedi una copia
773.88 kB Adobe PDF   Visualizza/Apri   Richiedi una copia

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11365/1230776