In this paper we aim to compare different Machine Learning approaches to solve a production problem in embedded devices production factories. In our case, a set of electronics components have to be assembled in a specific order and folded by screws to compose the final product. It could happen that some of the screws may be forgotten. To help the operator we implemented a visual detection system able to detect missing screws. The system is based on two algorithms - YOLO and Binary Classification with two radically different approaches. We also aimed to verify if the ensemble of these two algorithms will be more robust to the insurgence of false-positives predictions and to prototype a solution that smoothly integrates in the LEAN production line.

Burresi, G., Lorusso, M., Graziani, L., Comacchio, A., Trotta, F., Rizzo, A. (2021). Image-based defect detection in assembly line with Machine Learning. In 2021 10th Mediterranean Conference on Embedded Computing (MECO) (pp.1-5). New York : IEEE [10.1109/MECO52532.2021.9460291].

Image-based defect detection in assembly line with Machine Learning

Burresi, Giovanni;Lorusso, Martino;Graziani, Lisa;Comacchio, Alice;Rizzo, Antonio
2021-01-01

Abstract

In this paper we aim to compare different Machine Learning approaches to solve a production problem in embedded devices production factories. In our case, a set of electronics components have to be assembled in a specific order and folded by screws to compose the final product. It could happen that some of the screws may be forgotten. To help the operator we implemented a visual detection system able to detect missing screws. The system is based on two algorithms - YOLO and Binary Classification with two radically different approaches. We also aimed to verify if the ensemble of these two algorithms will be more robust to the insurgence of false-positives predictions and to prototype a solution that smoothly integrates in the LEAN production line.
2021
978-1-6654-3912-1
Burresi, G., Lorusso, M., Graziani, L., Comacchio, A., Trotta, F., Rizzo, A. (2021). Image-based defect detection in assembly line with Machine Learning. In 2021 10th Mediterranean Conference on Embedded Computing (MECO) (pp.1-5). New York : IEEE [10.1109/MECO52532.2021.9460291].
File in questo prodotto:
File Dimensione Formato  
Image-Based_Defect_Detection_in_Assembly_Line_with_Machine_Learning.pdf

non disponiibile

Tipologia: PDF editoriale
Licenza: NON PUBBLICO - Accesso privato/ristretto
Dimensione 1.63 MB
Formato Adobe PDF
1.63 MB Adobe PDF   Visualizza/Apri   Richiedi una copia

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11365/1218518