In this paper we aim to compare different Machine Learning approaches to solve a production problem in embedded devices production factories. In our case, a set of electronics components have to be assembled in a specific order and folded by screws to compose the final product. It could happen that some of the screws may be forgotten. To help the operator we implemented a visual detection system able to detect missing screws. The system is based on two algorithms - YOLO and Binary Classification with two radically different approaches. We also aimed to verify if the ensemble of these two algorithms will be more robust to the insurgence of false-positives predictions and to prototype a solution that smoothly integrates in the LEAN production line.
Burresi, G., Lorusso, M., Graziani, L., Comacchio, A., Trotta, F., Rizzo, A. (2021). Image-based defect detection in assembly line with Machine Learning. In 2021 10th Mediterranean Conference on Embedded Computing (MECO) (pp.1-5). New York : IEEE [10.1109/MECO52532.2021.9460291].
Image-based defect detection in assembly line with Machine Learning
Burresi, Giovanni;Lorusso, Martino;Graziani, Lisa;Comacchio, Alice;Rizzo, Antonio
2021-01-01
Abstract
In this paper we aim to compare different Machine Learning approaches to solve a production problem in embedded devices production factories. In our case, a set of electronics components have to be assembled in a specific order and folded by screws to compose the final product. It could happen that some of the screws may be forgotten. To help the operator we implemented a visual detection system able to detect missing screws. The system is based on two algorithms - YOLO and Binary Classification with two radically different approaches. We also aimed to verify if the ensemble of these two algorithms will be more robust to the insurgence of false-positives predictions and to prototype a solution that smoothly integrates in the LEAN production line.| File | Dimensione | Formato | |
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https://hdl.handle.net/11365/1218518
