In this brief paper we present a low-complexity digital architecture for the probabilistic characterization of ergodic TRBGs. Differently from other methods based on the direct estimation of the generation probabilities of finite sets of binary words, in this study we investigate some theoretical relationships between the autocorrelation function of the binary source and the dynamical symbol generation probabilities, that can be exploited to obtain a probabilistic characterization of the TRBG. The solution is proposed to perform a real-time monitoring of TRBGs, that can be suitably implemented in lightweight digital systems.

Addabbo, T., Fort, A., Mugnaini, M., & Vignoli, V. (2017). A lightweight digital system for the probabilistic characterization of true random bit generators. In 2017 European Conference on Circuit Theory and Design, ECCTD 2017 (pp.1-4). New York : Institute of Electrical and Electronics Engineers Inc. [10.1109/ECCTD.2017.8093238].

A lightweight digital system for the probabilistic characterization of true random bit generators

Addabbo, Tommaso;Fort, Ada;Mugnaini, Marco;Vignoli, Valerio
2017

Abstract

In this brief paper we present a low-complexity digital architecture for the probabilistic characterization of ergodic TRBGs. Differently from other methods based on the direct estimation of the generation probabilities of finite sets of binary words, in this study we investigate some theoretical relationships between the autocorrelation function of the binary source and the dynamical symbol generation probabilities, that can be exploited to obtain a probabilistic characterization of the TRBG. The solution is proposed to perform a real-time monitoring of TRBGs, that can be suitably implemented in lightweight digital systems.
9781538639740
Addabbo, T., Fort, A., Mugnaini, M., & Vignoli, V. (2017). A lightweight digital system for the probabilistic characterization of true random bit generators. In 2017 European Conference on Circuit Theory and Design, ECCTD 2017 (pp.1-4). New York : Institute of Electrical and Electronics Engineers Inc. [10.1109/ECCTD.2017.8093238].
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11365/1033942