In this work we discuss the limitations of the localized transmission of electromagnetic energy at microwaves. The nondiffractive features of localized pulses are evaluated in terms of the main spot size over both the propagating and the transverse axis. By defining an original theoretical framework, we show that, even in the nondispersive case, it is not always possible to efficiently confine electromagnetic pulses. Results show that the considered fractional bandwidth plays a key role in the confinement properties of such pulses, posing well-defined constraints to the practical realization of localized pulses in the microwave range.

Fuscaldo, W., Pavone, S.C., Valerio, G., Galli, A., Albani, M., Ettorre, M. (2016). Parameterization of the nondiffractive features of electromagnetic localized pulses. In 2016 IEEE Antennas and Propagation Society International Symposium, APSURSI 2016 - Proceedings (pp.869-870). New York : Institute of Electrical and Electronics Engineers Inc. [10.1109/APS.2016.7696143].

Parameterization of the nondiffractive features of electromagnetic localized pulses

Albani, Matteo;
2016-01-01

Abstract

In this work we discuss the limitations of the localized transmission of electromagnetic energy at microwaves. The nondiffractive features of localized pulses are evaluated in terms of the main spot size over both the propagating and the transverse axis. By defining an original theoretical framework, we show that, even in the nondispersive case, it is not always possible to efficiently confine electromagnetic pulses. Results show that the considered fractional bandwidth plays a key role in the confinement properties of such pulses, posing well-defined constraints to the practical realization of localized pulses in the microwave range.
2016
9781509028863
Fuscaldo, W., Pavone, S.C., Valerio, G., Galli, A., Albani, M., Ettorre, M. (2016). Parameterization of the nondiffractive features of electromagnetic localized pulses. In 2016 IEEE Antennas and Propagation Society International Symposium, APSURSI 2016 - Proceedings (pp.869-870). New York : Institute of Electrical and Electronics Engineers Inc. [10.1109/APS.2016.7696143].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11365/1007235